Experience Basler’s innovative vision solutions first-hand at Semicon SEA 2025!

High-speed defect detection in real-time 

This demo showcases a high-performance line scan vision system designed for continuous web inspection. While originally applied in battery cell production, but highly relevant for semiconductor processes where detecting fine surface defects on films, foils, or substrates is critical.

As semiconductor manufacturing increasingly relies on flexible materials and thin-film processes the need for real-time, high-resolution inspection becomes vital. Basler's line scan vision solution ensures high throughput and image quality, efficiently managing data with reliable acquisition, targeted preprocessing via the frame grabber for ROI, and seamless ROI analysis with pylon vTools software, ensuring straightforward integration and compatibility.